Defect Classification
A. Guideline
1. This inspection protocol will be applied
2. Sampling Plan: ISO 2859 Single Sampling Plans for Normal Inspection
Sample Size: General Inspection Level II AQL: Critical=0.0 (none allowed) Major=1.0 Minor=2.5
3. Defect definition Critical Defect:
A defect likely to result in a hazardous or unsafe condition for an individual using the product or fails to meet mandatory regulations. Major Defect: a defect that is likely to result in failure, reduce the usability & salability and can easily be detected by the customer.
Minor Defect:
A defect that does not reduce the usability of the product, can be noticed only after careful examination, and may reduce the salability.
he classification of a defect depends on the degree of severity. If any found defect is not mentioned in this inspection protocol, it will be classified according to above definition
4. If there is a defect such that the factory intends to produce, the defect will be reported in the Remark of the inspection report. The inspection result will be either pending or fail.
5. All items in this inspection protocol are applied only when applicable. This inspection protocol does not necessarily include all defects found during inspection.
6. The product category definition of E&E is as below:
Product Category |
Definition |
Accessory | Not designed for independent usage. Examples: cord, transformer |
Luminaire | All kinds of lighting products that is powered by household voltages |
Audio & Video Products | Products that generate audio and/or video signals |
Electric Appliance | Powered by mains |
Electronic Product | Products requiring low input voltage ( |
IT & Telecom Products | Products and accessories used in IT & telecom industries |
B. Defect Classification
Note: Visual check – at a distance of 30 cm
Measurements done according to individual product specific data sheets
CRI – Critical / MAJ – Major / MIN – Minor